Surface structure determination by x-ray standing waves at a free-electron laser

Surface structure determination by x-ray standing waves at a free-electron laser

We demonstrate the structural sensitivity and accuracy of the x-ray standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO _2 of Mo/Si multilayers. These experiments open up the possibility to obtain...

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Bibliographic Details
Main Authors: G Mercurio, I A Makhotkin, I Milov, Y Y Kim, I A Zaluzhnyy, S Dziarzhytski, L Wenthaus, I A Vartanyants, W Wurth
Format: Article
Language:English
Published: IOP Publishing 2019-01-01
Series:New Journal of Physics
Subjects:
x-ray standing waves
free-electron lasers
multilayers
Online Access:https://doi.org/10.1088/1367-2630/aafa47

Internet

https://doi.org/10.1088/1367-2630/aafa47

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