Test signal generation for analog circuits
In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a...
| Main Authors: | , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2003-01-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/1/235/2003/ars-1-235-2003.pdf |