Test signal generation for analog circuits
In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a...
| Main Authors: | , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2003-01-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/1/235/2003/ars-1-235-2003.pdf |
| _version_ | 1818806366506057728 |
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| author | B. Burdiek W. Mathis |
| author_facet | B. Burdiek W. Mathis |
| author_sort | B. Burdiek |
| collection | DOAJ |
| description | In this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation problem of finding optimal test stimuli detecting all faults form the fault set is formulated as an optimal control problem. The solution of the optimal control problem representing the test stimuli is computed using an optimization procedure. The optimization procedure is based on the necessary conditions for optimality like the maximum principle of Pontryagin and adjoint circuit equations. |
| first_indexed | 2024-12-18T19:08:38Z |
| format | Article |
| id | doaj.art-fa5c394dac25471db64323fe938b92ea |
| institution | Directory Open Access Journal |
| issn | 1684-9965 1684-9973 |
| language | deu |
| last_indexed | 2024-12-18T19:08:38Z |
| publishDate | 2003-01-01 |
| publisher | Copernicus Publications |
| record_format | Article |
| series | Advances in Radio Science |
| spelling | doaj.art-fa5c394dac25471db64323fe938b92ea2022-12-21T20:56:21ZdeuCopernicus PublicationsAdvances in Radio Science1684-99651684-99732003-01-011235238Test signal generation for analog circuitsB. BurdiekW. MathisIn this paper a new test signal generation approach for general analog circuits based on the variational calculus and modern control theory methods is presented. The computed transient test signals also called test stimuli are optimal with respect to the detection of a given fault set by means of a predefined merit functional representing a fault detection criterion. The test signal generation problem of finding optimal test stimuli detecting all faults form the fault set is formulated as an optimal control problem. The solution of the optimal control problem representing the test stimuli is computed using an optimization procedure. The optimization procedure is based on the necessary conditions for optimality like the maximum principle of Pontryagin and adjoint circuit equations.http://www.adv-radio-sci.net/1/235/2003/ars-1-235-2003.pdf |
| spellingShingle | B. Burdiek W. Mathis Test signal generation for analog circuits Advances in Radio Science |
| title | Test signal generation for analog circuits |
| title_full | Test signal generation for analog circuits |
| title_fullStr | Test signal generation for analog circuits |
| title_full_unstemmed | Test signal generation for analog circuits |
| title_short | Test signal generation for analog circuits |
| title_sort | test signal generation for analog circuits |
| url | http://www.adv-radio-sci.net/1/235/2003/ars-1-235-2003.pdf |
| work_keys_str_mv | AT bburdiek testsignalgenerationforanalogcircuits AT wmathis testsignalgenerationforanalogcircuits |