Development of microcontroller-based draft measuring system using Xbee technology

AbstractNumerous wired data acquisition systems were developed in the past, for measurement of draft, which were often characterized by complexity and operational difficulty. Consequently, it is necessary to upgrade the exiting draft measurement technique of an agricultural implement. Therefore, thi...

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Bibliographic Details
Main Authors: Arjun Chouriya, V. K. Tewari, Peeyush Soni, Naseeb Singh, Pradeep Kumar
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Cogent Engineering
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/23311916.2024.2331178