Recent advances in oblique plane microscopy
Oblique plane microscopy (OPM) directly captures object information in a plane tilted from the focal plane of the objective lens without the need for slow z-stack acquisition. This unconventional widefield imaging approach is made possible by using a remote focusing principle that eliminates optical...
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| Format: | Article |
| Language: | English |
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De Gruyter
2023-04-01
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| Series: | Nanophotonics |
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| Online Access: | https://doi.org/10.1515/nanoph-2023-0002 |