Conductive atomic force microscopy studies of charged domain walls in KTiOPO4
We study the conductive properties of charged domain walls in KTiOPO4 using conductive atomic force microscopy. We show that the region of increased conductivity at the domain wall broadens when the wall is in motion, extending from the initial wall position to the final wall position. When wall mot...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2018-08-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5042034 |