Delamination of Plasticized Devices in Dynamic Service Environments

With the continuous development of advanced packaging technology in heterogeneous semiconductor integration, the delamination failure problem in a dynamic service environment has gradually become a key factor limiting the reliability of packaging devices. In this paper, the delamination failure mech...

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Bibliographic Details
Main Authors: Wenchao Tian, Xuyang Chen, Guoguang Zhang, Yuanming Chen, Jijun Luo
Format: Article
Language:English
Published: MDPI AG 2024-03-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/15/3/376