Enhancing Reliability of Studies on Single Filament Memristive Switching via an Unconventional cAFM Approach

Enhancing Reliability of Studies on Single Filament Memristive Switching via an Unconventional cAFM Approach

Memristive devices are highly promising for implementing neuromorphic functionalities in future electronic hardware, and direct insights into memristive phenomena on the nanoscale are of fundamental importance to reaching this. Conductive atomic force microscopy (cAFM) has proven to be an essential...

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Bibliographic Details
Main Authors: Niko Carstens, Alexander Vahl, Ole Gronenberg, Thomas Strunskus, Lorenz Kienle, Franz Faupel, Abdou Hassanien
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Nanomaterials
Subjects:
neuromorphic engineering
cAFM
diffusive memristive switching
resistive switching
memristors
spiking dynamics
Online Access:https://www.mdpi.com/2079-4991/11/2/265

Internet

https://www.mdpi.com/2079-4991/11/2/265

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