Interferometric Wavefront Sensing System Based on Deep Learning
At present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great s...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/10/23/8460 |