Interferometric Wavefront Sensing System Based on Deep Learning
At present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great s...
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MDPI AG
2020-11-01
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Series: | Applied Sciences |
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Online Access: | https://www.mdpi.com/2076-3417/10/23/8460 |
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author | Yuhao Niu Zhan Gao Chenjia Gao Jieming Zhao Xu Wang |
author_facet | Yuhao Niu Zhan Gao Chenjia Gao Jieming Zhao Xu Wang |
author_sort | Yuhao Niu |
collection | DOAJ |
description | At present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great success in the field of computer vision, and it has been widely used in the research of image classification and data fitting. Here, we apply deep learning algorithms to the interferometric system to detect wavefront under general conditions. This method can accurately extract the wavefront phase distribution and analyze aberrations, and it is verified by experiments that this method not only has higher measurement accuracy and faster calculation speed but also has good performance in the noisy environments. |
first_indexed | 2024-03-10T14:31:38Z |
format | Article |
id | doaj.art-fbb542cb95dc4d49a792952a874445c9 |
institution | Directory Open Access Journal |
issn | 2076-3417 |
language | English |
last_indexed | 2024-03-10T14:31:38Z |
publishDate | 2020-11-01 |
publisher | MDPI AG |
record_format | Article |
series | Applied Sciences |
spelling | doaj.art-fbb542cb95dc4d49a792952a874445c92023-11-20T22:33:19ZengMDPI AGApplied Sciences2076-34172020-11-011023846010.3390/app10238460Interferometric Wavefront Sensing System Based on Deep LearningYuhao Niu0Zhan Gao1Chenjia Gao2Jieming Zhao3Xu Wang4Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaAt present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great success in the field of computer vision, and it has been widely used in the research of image classification and data fitting. Here, we apply deep learning algorithms to the interferometric system to detect wavefront under general conditions. This method can accurately extract the wavefront phase distribution and analyze aberrations, and it is verified by experiments that this method not only has higher measurement accuracy and faster calculation speed but also has good performance in the noisy environments.https://www.mdpi.com/2076-3417/10/23/8460adaptive opticsfringe pattern analysiswavefront aberrationdeep learning |
spellingShingle | Yuhao Niu Zhan Gao Chenjia Gao Jieming Zhao Xu Wang Interferometric Wavefront Sensing System Based on Deep Learning Applied Sciences adaptive optics fringe pattern analysis wavefront aberration deep learning |
title | Interferometric Wavefront Sensing System Based on Deep Learning |
title_full | Interferometric Wavefront Sensing System Based on Deep Learning |
title_fullStr | Interferometric Wavefront Sensing System Based on Deep Learning |
title_full_unstemmed | Interferometric Wavefront Sensing System Based on Deep Learning |
title_short | Interferometric Wavefront Sensing System Based on Deep Learning |
title_sort | interferometric wavefront sensing system based on deep learning |
topic | adaptive optics fringe pattern analysis wavefront aberration deep learning |
url | https://www.mdpi.com/2076-3417/10/23/8460 |
work_keys_str_mv | AT yuhaoniu interferometricwavefrontsensingsystembasedondeeplearning AT zhangao interferometricwavefrontsensingsystembasedondeeplearning AT chenjiagao interferometricwavefrontsensingsystembasedondeeplearning AT jiemingzhao interferometricwavefrontsensingsystembasedondeeplearning AT xuwang interferometricwavefrontsensingsystembasedondeeplearning |