Interferometric Wavefront Sensing System Based on Deep Learning

At present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great s...

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Main Authors: Yuhao Niu, Zhan Gao, Chenjia Gao, Jieming Zhao, Xu Wang
Format: Article
Language:English
Published: MDPI AG 2020-11-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/10/23/8460
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author Yuhao Niu
Zhan Gao
Chenjia Gao
Jieming Zhao
Xu Wang
author_facet Yuhao Niu
Zhan Gao
Chenjia Gao
Jieming Zhao
Xu Wang
author_sort Yuhao Niu
collection DOAJ
description At present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great success in the field of computer vision, and it has been widely used in the research of image classification and data fitting. Here, we apply deep learning algorithms to the interferometric system to detect wavefront under general conditions. This method can accurately extract the wavefront phase distribution and analyze aberrations, and it is verified by experiments that this method not only has higher measurement accuracy and faster calculation speed but also has good performance in the noisy environments.
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spelling doaj.art-fbb542cb95dc4d49a792952a874445c92023-11-20T22:33:19ZengMDPI AGApplied Sciences2076-34172020-11-011023846010.3390/app10238460Interferometric Wavefront Sensing System Based on Deep LearningYuhao Niu0Zhan Gao1Chenjia Gao2Jieming Zhao3Xu Wang4Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaKey Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, ChinaAt present, most wavefront sensing methods analyze the wavefront aberration from light intensity images taken in dark environments. However, in general conditions, these methods are limited due to the interference of various external light sources. In recent years, deep learning has achieved great success in the field of computer vision, and it has been widely used in the research of image classification and data fitting. Here, we apply deep learning algorithms to the interferometric system to detect wavefront under general conditions. This method can accurately extract the wavefront phase distribution and analyze aberrations, and it is verified by experiments that this method not only has higher measurement accuracy and faster calculation speed but also has good performance in the noisy environments.https://www.mdpi.com/2076-3417/10/23/8460adaptive opticsfringe pattern analysiswavefront aberrationdeep learning
spellingShingle Yuhao Niu
Zhan Gao
Chenjia Gao
Jieming Zhao
Xu Wang
Interferometric Wavefront Sensing System Based on Deep Learning
Applied Sciences
adaptive optics
fringe pattern analysis
wavefront aberration
deep learning
title Interferometric Wavefront Sensing System Based on Deep Learning
title_full Interferometric Wavefront Sensing System Based on Deep Learning
title_fullStr Interferometric Wavefront Sensing System Based on Deep Learning
title_full_unstemmed Interferometric Wavefront Sensing System Based on Deep Learning
title_short Interferometric Wavefront Sensing System Based on Deep Learning
title_sort interferometric wavefront sensing system based on deep learning
topic adaptive optics
fringe pattern analysis
wavefront aberration
deep learning
url https://www.mdpi.com/2076-3417/10/23/8460
work_keys_str_mv AT yuhaoniu interferometricwavefrontsensingsystembasedondeeplearning
AT zhangao interferometricwavefrontsensingsystembasedondeeplearning
AT chenjiagao interferometricwavefrontsensingsystembasedondeeplearning
AT jiemingzhao interferometricwavefrontsensingsystembasedondeeplearning
AT xuwang interferometricwavefrontsensingsystembasedondeeplearning