Damage assessment and economic injury level of the two-spotted spider mite Tetranychus urticae in soybean

Abstract: The objective of this work was to quantify the reduction of soybean grain yield caused by Tetranychus urticae damage, and to propose an economic injury level (EIL) for this pest in the crop. The experimental design was set up in randomized complete blocks, with four replicates and a 4x2 fa...

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Bibliographic Details
Main Authors: Guilherme Padilha, Rubens Alex Fiorin, Alberto Cargnelutti Filho, Henrique Pozebon, John Rogers, Rafael Paz Marques, Lauren Brondani Castilhos, Alessandro Donatti, Lucas Stefanelo, Leonardo Moreira Burtet, Regis Felipe Stacke, Jerson Vanderlei Carús Guedes, Jonas André Arnemann
Format: Article
Language:English
Published: Embrapa Informação Tecnológica
Series:Pesquisa Agropecuária Brasileira
Subjects:
Online Access:http://www.scielo.br/pdf/pab/v55/1678-3921-pab-55-e01836.pdf