Yield-SpikeSegNet: An Extension of SpikeSegNet Deep-Learning Approach for the Yield Estimation in the Wheat Using Visual Images

High-throughput plant phenotyping integrated with computer vision is an emerging topic in the domain of nondestructive and noninvasive plant breeding. Analysis of the emerging grain spikes and the grain weight or yield estimation in the wheat plant for a huge number of genotypes in a nondestructive...

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Bibliographic Details
Main Authors: Tanuj Misra, Alka Arora, Sudeep Marwaha, Ranjeet Ranjan Jha, Mrinmoy Ray, Shailendra Kumar, Sudhir Kumar, Viswanathan Chinnusamy
Format: Article
Language:English
Published: Taylor & Francis Group 2022-12-01
Series:Applied Artificial Intelligence
Online Access:http://dx.doi.org/10.1080/08839514.2022.2137642