Single-Shot Phase Measuring Profilometry Based on Quaternary Grating Projection
In this paper, we propose a new single-shot three-dimensional (3D) measuring method based on quaternary grating projection. In traditional binary grating phase measuring profilometry (PMP), a multi-step or color fringe pattern are usually used to extract the sinusoidal fringes. In our proposed metho...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2021-03-01
|
| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/11/6/2536 |