Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Oscillation-based testing (OBT) and Oscillation-based built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue and RF circuits, but both are sensitive to process, voltage and temperature (PVT) variation. This paper investigates 15 OBT and OBIST feature extraction st...

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Bibliographic Details
Main Authors: Hendrik P. Nel, Fortunato Carlos Dualibe, Tinus Stander
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Open Journal of Circuits and Systems
Subjects:
Built-in self-test
circuit simulation
CMOS
design for testability
LNA
microwave integrated circuits
Online Access:https://ieeexplore.ieee.org/document/10002329/

Internet

https://ieeexplore.ieee.org/document/10002329/

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