An Optimized Error Compensation Method for Phase Measurement Profilometry
Phase measurement profilometry (PMP) is primarily employed to analyze the morphology of a functional surface with precision. Historically, one of the most complex and persistent challenges in PMP has been reducing errors stemming from inconsistent indicators at the edges of a surface. In response to...
Main Authors: | , , , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2023-09-01
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Series: | Photonics |
Subjects: | |
Online Access: | https://www.mdpi.com/2304-6732/10/9/1036 |