An Optimized Error Compensation Method for Phase Measurement Profilometry

Phase measurement profilometry (PMP) is primarily employed to analyze the morphology of a functional surface with precision. Historically, one of the most complex and persistent challenges in PMP has been reducing errors stemming from inconsistent indicators at the edges of a surface. In response to...

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Bibliographic Details
Main Authors: Benjun Guo, Yuanping Xu, Chaolong Zhang, Jianfeng Tang, Dan Tang, Chao Kong, Jin Jin
Format: Article
Language:English
Published: MDPI AG 2023-09-01
Series:Photonics
Subjects:
Online Access:https://www.mdpi.com/2304-6732/10/9/1036