Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap

Underlap between gate and drain/source area is one of the important items non-ideal effects in the device manufacturing process in the nanometer scale. In this paper, for the first time, the effect of underlap between the gate and drain/source area for tunneling carbon nanotube field effects transis...

Full description

Bibliographic Details
Main Authors: Ali Naderi, Maryam Ghodrati
Format: Article
Language:fas
Published: Semnan University 2019-12-01
Series:مجله مدل سازی در مهندسی
Subjects:
Online Access:https://modelling.semnan.ac.ir/article_4161_07b040071f9fe23f59e6ad4b1de5444e.pdf
_version_ 1827342373763416064
author Ali Naderi
Maryam Ghodrati
author_facet Ali Naderi
Maryam Ghodrati
author_sort Ali Naderi
collection DOAJ
description Underlap between gate and drain/source area is one of the important items non-ideal effects in the device manufacturing process in the nanometer scale. In this paper, for the first time, the effect of underlap between the gate and drain/source area for tunneling carbon nanotube field effects transistor is investigated. To simulate the device, self- consistent solution of Schrodinger and Poisson equations and Non-equilibrium Green’s Function method have been employed. The function of the device is evaluated in terms of the on-state current, off-state current, current ratio, sub-threshold swing, delay time, and the power delay product. The simulation results show that the underlap effect improves some of the device characteristics and has some adverse effects on other characteristics. In the case where the length of underlap area is optimally chosen, the device performance will be improved considerably. Simulation results indicate that underlap significantly reduces the off-state current and thus reduces band-to-band tunneling and ambipolar behavior of the device. Also, the underlap effect by improving the power delay product parameter is a suitable option for low power applications compared with the conventional structure.
first_indexed 2024-03-07T22:06:46Z
format Article
id doaj.art-fcec5c4a1c564529b121e6843958ff0b
institution Directory Open Access Journal
issn 2008-4854
2783-2538
language fas
last_indexed 2024-03-07T22:06:46Z
publishDate 2019-12-01
publisher Semnan University
record_format Article
series مجله مدل سازی در مهندسی
spelling doaj.art-fcec5c4a1c564529b121e6843958ff0b2024-02-23T19:07:03ZfasSemnan Universityمجله مدل سازی در مهندسی2008-48542783-25382019-12-01175921522410.22075/jme.2019.17482.17044161Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of UnderlapAli Naderi0Maryam Ghodrati1Electrical engineering department, Energy faculty, Kermanshah University of TechnologyElectrical engineering department, Engineering Faculty, Lorestan UniversityUnderlap between gate and drain/source area is one of the important items non-ideal effects in the device manufacturing process in the nanometer scale. In this paper, for the first time, the effect of underlap between the gate and drain/source area for tunneling carbon nanotube field effects transistor is investigated. To simulate the device, self- consistent solution of Schrodinger and Poisson equations and Non-equilibrium Green’s Function method have been employed. The function of the device is evaluated in terms of the on-state current, off-state current, current ratio, sub-threshold swing, delay time, and the power delay product. The simulation results show that the underlap effect improves some of the device characteristics and has some adverse effects on other characteristics. In the case where the length of underlap area is optimally chosen, the device performance will be improved considerably. Simulation results indicate that underlap significantly reduces the off-state current and thus reduces band-to-band tunneling and ambipolar behavior of the device. Also, the underlap effect by improving the power delay product parameter is a suitable option for low power applications compared with the conventional structure.https://modelling.semnan.ac.ir/article_4161_07b040071f9fe23f59e6ad4b1de5444e.pdfleakage currentpower delay producttunneling carbon nanotube field effects transistornon-equilibrium green’s function (negf)
spellingShingle Ali Naderi
Maryam Ghodrati
Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
مجله مدل سازی در مهندسی
leakage current
power delay product
tunneling carbon nanotube field effects transistor
non-equilibrium green’s function (negf)
title Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
title_full Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
title_fullStr Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
title_full_unstemmed Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
title_short Improvement in the Performance of Tunneling Carbon Nanotube Field Effects Transistor in Presence of Underlap
title_sort improvement in the performance of tunneling carbon nanotube field effects transistor in presence of underlap
topic leakage current
power delay product
tunneling carbon nanotube field effects transistor
non-equilibrium green’s function (negf)
url https://modelling.semnan.ac.ir/article_4161_07b040071f9fe23f59e6ad4b1de5444e.pdf
work_keys_str_mv AT alinaderi improvementintheperformanceoftunnelingcarbonnanotubefieldeffectstransistorinpresenceofunderlap
AT maryamghodrati improvementintheperformanceoftunnelingcarbonnanotubefieldeffectstransistorinpresenceofunderlap