Open‐circuit submodule fault diagnosis in MMCs using support vector machines
Abstract Series connection of semiconductor submodules (SM) in a modular multilevel converter (MMC) makes the MMC prone to open‐circuit (OC) IGBT failures inside SMs. If left undetected, these faults degrade the operation of the MMC and lead to its instability. This article proposes a method to dete...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2022-12-01
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| Series: | IET Generation, Transmission & Distribution |
| Online Access: | https://doi.org/10.1049/gtd2.12652 |