Correction: A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys.

Correction: A New Extension of the Binomial Error Model for Responses to Items of Varying Difficulty in Educational Testing and Attitude Surveys.

Bibliographic Details
Main Authors: James A Wiley, John Levi Martin, Stephen J Herschkorn, Jason Bond
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2015-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC4669111?pdf=render

Internet

http://europepmc.org/articles/PMC4669111?pdf=render

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