SEC-BADAEC: An Efficient ECC With No Vacancy for Strong Memory Protection
Shrinking process technology and rising memory densities have made memories increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced <italic>On-die Error Correction Code (O-ECC)</italic> to protect data against the growing number of errors. Current O-ECC provides weak...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2022-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9866743/ |