Prediction of Device Characteristics of Feedback Field-Effect Transistors Using TCAD-Augmented Machine Learning

Prediction of Device Characteristics of Feedback Field-Effect Transistors Using TCAD-Augmented Machine Learning

In this study, the device characteristics of silicon nanowire feedback field-effect transistors were predicted using technology computer-aided design (TCAD)-augmented machine learning (TCAD-ML). The full current–voltage (<i>I-V</i>) curves in forward and reverse voltage sweeps were predi...

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Bibliographic Details
Main Authors: Sola Woo, Juhee Jeon, Sangsig Kim
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Micromachines
Subjects:
feedback field-effect transistors
machine learning
random forest regression
technology computer-aided design (TCAD)
TCAD-augmented machine learning
Online Access:https://www.mdpi.com/2072-666X/14/3/504

Internet

https://www.mdpi.com/2072-666X/14/3/504

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