Diffraction Enhanced Imaging Analysis with Pseudo-Voigt Fit Function

Diffraction Enhanced Imaging Analysis with Pseudo-Voigt Fit Function

Diffraction enhanced imaging (DEI) is an advanced digital radiographic imaging technique employing the refraction of X-rays to contrast internal interfaces. This study aims to qualitatively and quantitatively evaluate images acquired using this technique and to assess how different fitting functions...

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Bibliographic Details
Main Authors: Deepak Mani, Andreas Kupsch, Bernd R. Müller, Giovanni Bruno
Format: Article
Language:English
Published: MDPI AG 2022-07-01
Series:Journal of Imaging
Subjects:
diffraction enhanced imaging
analyzer-based imaging
X-ray refraction
non-destructive evaluation
Pseudo-Voigt fit function
Python
Online Access:https://www.mdpi.com/2313-433X/8/8/206

Internet

https://www.mdpi.com/2313-433X/8/8/206

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