Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images

Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images

The morphology of nanoparticles governs their properties for a range of important applications. Thus, the ability to statistically correlate this key particle performance parameter is paramount in achieving accurate control of nanoparticle properties. Among several effective techniques for morpholog...

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Bibliographic Details
Main Authors: Haotian Wen, José María Luna-Romera, José C. Riquelme, Christian Dwyer, Shery L. Y. Chang
Format: Article
Language:English
Published: MDPI AG 2021-10-01
Series:Nanomaterials
Subjects:
nanoparticles
image analysis
machine learning
Online Access:https://www.mdpi.com/2079-4991/11/10/2706

Internet

https://www.mdpi.com/2079-4991/11/10/2706

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