Studies of probe tip materials by atomic force microscopy: a review
As a tool that can test insulators' surface morphology and properties, the performance index of atomic force microscope (AFM) probes is the most critical factor in determining the resolution of microscopy, and the performance of probes varies in various modes and application requirements. This...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2022-11-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.13.104 |