Power Pattern Sensitivity to Calibration Errors and Mutual Coupling in Linear Arrays through Circular Interval Arithmetics

The sensitivity to both calibration errors and mutual coupling effects of the power pattern radiated by a linear array is addressed. Starting from the knowledge of the nominal excitations of the array elements and the maximum uncertainty on their amplitudes, the bounds of the pattern deviations from...

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Bibliographic Details
Main Authors: Nicola Anselmi, Marco Salucci, Paolo Rocca, Andrea Massa
Format: Article
Language:English
Published: MDPI AG 2016-05-01
Series:Sensors
Subjects:
Online Access:http://www.mdpi.com/1424-8220/16/6/791