Adhesion of voids to bimetal interfaces with non-uniform energies

Adhesion of voids to bimetal interfaces with non-uniform energies

Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...

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Bibliographic Details
Main Authors: Zheng, Shijian, Shao, Shuai, Zhang, Jian, Wang, Yongqiang, Demkowicz, Michael J., Beyerlein, Irene J., Mara, Nathan A.
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:en_US
Published: Nature Publishing Group 2015
Online Access:http://hdl.handle.net/1721.1/100530
https://orcid.org/0000-0003-3949-0441

Internet

http://hdl.handle.net/1721.1/100530
https://orcid.org/0000-0003-3949-0441

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