Adhesion of voids to bimetal interfaces with non-uniform energies
Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | en_US |
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Nature Publishing Group
2015
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| Online Access: | http://hdl.handle.net/1721.1/100530 https://orcid.org/0000-0003-3949-0441 |
| _version_ | 1810975257315508224 |
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| author | Zheng, Shijian Shao, Shuai Zhang, Jian Wang, Yongqiang Demkowicz, Michael J. Beyerlein, Irene J. Mara, Nathan A. |
| author2 | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
| author_facet | Massachusetts Institute of Technology. Department of Materials Science and Engineering Zheng, Shijian Shao, Shuai Zhang, Jian Wang, Yongqiang Demkowicz, Michael J. Beyerlein, Irene J. Mara, Nathan A. |
| author_sort | Zheng, Shijian |
| collection | MIT |
| description | Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an interesting phenomenon in their interaction, wherein voids adhere to only one side of the bimetal interfaces rather than overlapping them. We show that this asymmetrical void-interface interaction is a consequence of differing surface energies of the two metals and non-uniformity in their interface formation energy. Specifically, voids grow within the phase of lower surface energy and wet only the high-interface energy regions. Furthermore, because this outcome cannot be accounted for by wetting of interfaces with uniform internal energy, our report provides experimental evidence that bimetal interfaces contain non-uniform internal energy distributions. This work also indicates that to design irradiation-resistant materials, we can avoid void-interface overlap via tuning the configurations of interfaces. |
| first_indexed | 2024-09-23T08:36:30Z |
| format | Article |
| id | mit-1721.1/100530 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T08:36:30Z |
| publishDate | 2015 |
| publisher | Nature Publishing Group |
| record_format | dspace |
| spelling | mit-1721.1/1005302022-09-23T13:17:00Z Adhesion of voids to bimetal interfaces with non-uniform energies Zheng, Shijian Shao, Shuai Zhang, Jian Wang, Yongqiang Demkowicz, Michael J. Beyerlein, Irene J. Mara, Nathan A. Massachusetts Institute of Technology. Department of Materials Science and Engineering Demkowicz, Michael J. Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an interesting phenomenon in their interaction, wherein voids adhere to only one side of the bimetal interfaces rather than overlapping them. We show that this asymmetrical void-interface interaction is a consequence of differing surface energies of the two metals and non-uniformity in their interface formation energy. Specifically, voids grow within the phase of lower surface energy and wet only the high-interface energy regions. Furthermore, because this outcome cannot be accounted for by wetting of interfaces with uniform internal energy, our report provides experimental evidence that bimetal interfaces contain non-uniform internal energy distributions. This work also indicates that to design irradiation-resistant materials, we can avoid void-interface overlap via tuning the configurations of interfaces. United States. Dept. of Energy. Office of Basic Energy Sciences. Center for Materials at Irradiation and Mechanical Extremes (Award 2008LANL1026) 2015-12-28T14:16:19Z 2015-12-28T14:16:19Z 2015-10 2015-04 Article http://purl.org/eprint/type/JournalArticle 2045-2322 http://hdl.handle.net/1721.1/100530 Zheng, Shijian, Shuai Shao, Jian Zhang, Yongqiang Wang, Michael J. Demkowicz, Irene J. Beyerlein, and Nathan A. Mara. “Adhesion of Voids to Bimetal Interfaces with Non-Uniform Energies.” Scientific Reports 5 (October 21, 2015): 15428. https://orcid.org/0000-0003-3949-0441 en_US http://dx.doi.org/10.1038/srep15428 Scientific Reports Creative Commons Attribution http://creativecommons.org/licenses/by/4.0/ application/pdf Nature Publishing Group Nature Publishing Group |
| spellingShingle | Zheng, Shijian Shao, Shuai Zhang, Jian Wang, Yongqiang Demkowicz, Michael J. Beyerlein, Irene J. Mara, Nathan A. Adhesion of voids to bimetal interfaces with non-uniform energies |
| title | Adhesion of voids to bimetal interfaces with non-uniform energies |
| title_full | Adhesion of voids to bimetal interfaces with non-uniform energies |
| title_fullStr | Adhesion of voids to bimetal interfaces with non-uniform energies |
| title_full_unstemmed | Adhesion of voids to bimetal interfaces with non-uniform energies |
| title_short | Adhesion of voids to bimetal interfaces with non-uniform energies |
| title_sort | adhesion of voids to bimetal interfaces with non uniform energies |
| url | http://hdl.handle.net/1721.1/100530 https://orcid.org/0000-0003-3949-0441 |
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