Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material

Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material

Materials research with a focus on enhancing the minority-carrier lifetime of the light-absorbing semiconductor is key to advancing solar energy technology for both early stage and mature material platforms alike. Tin sulfide (SnS) is an absorber material with several clear advantages for manufactur...

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Bibliographic Details
Main Authors: Sher, Meng-Ju, Yang, Chuanxi, Hartman, Katy, Lindenberg, Aaron M., Gordon, Roy G., Jaramillo, Rafael, Ofori-Okai, Benjamin Kwasi, Steinmann, Vera, Nelson, Keith Adam, Buonassisi, Tonio
Other Authors: Massachusetts Institute of Technology. Department of Chemistry
Format: Article
Language:en_US
Published: American Institute of Physics (AIP) 2016
Online Access:http://hdl.handle.net/1721.1/102134
https://orcid.org/0000-0001-6715-5195
https://orcid.org/0000-0001-8345-4937
https://orcid.org/0000-0002-0737-6786
https://orcid.org/0000-0001-7804-5418
https://orcid.org/0000-0003-3116-6719

Internet

http://hdl.handle.net/1721.1/102134
https://orcid.org/0000-0001-6715-5195
https://orcid.org/0000-0001-8345-4937
https://orcid.org/0000-0002-0737-6786
https://orcid.org/0000-0001-7804-5418
https://orcid.org/0000-0003-3116-6719

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