Analysis of stress intensity factors and T-stress to control crack propagation for kerf-less spalling of single crystal silicon foils
Monocrystalline silicon (called mono silicon) is extensively used in the electronic and solar photovoltaic industries. During the last decade, many new manufacturing processes have been developed to improve solar cells’ efficiency while reducing their cost of production. This paper focuses on a kerf...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Elsevier
2016
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| Online Access: | http://hdl.handle.net/1721.1/105423 https://orcid.org/0000-0002-9060-227X |