DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon

Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.

Bibliographic Details
Main Author:	Thienprasit, Jeanne A. (Jeanne Athya)
Other Authors:	David K. Roylance.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2005
Subjects:	Physics
Online Access:	http://hdl.handle.net/1721.1/10613

Internet

http://hdl.handle.net/1721.1/10613