Thienprasit, J. A., & Roylance, D. K. (2005). DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon. Massachusetts Institute of Technology.
Chicago Style (17th ed.) CitationThienprasit, Jeanne A., and David K. Roylance. DLTS Characterization of Aluminum Gettering of Iron Contaminants in Boron-doped Silicon. Massachusetts Institute of Technology, 2005.
MLA (9th ed.) CitationThienprasit, Jeanne A., and David K. Roylance. DLTS Characterization of Aluminum Gettering of Iron Contaminants in Boron-doped Silicon. Massachusetts Institute of Technology, 2005.
Warning: These citations may not always be 100% accurate.