DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon
Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.
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| 格式: | Thesis |
| 语言: | eng |
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Massachusetts Institute of Technology
2005
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| 在线阅读: | http://hdl.handle.net/1721.1/10613 |
| _version_ | 1826208514979135488 |
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| author | Thienprasit, Jeanne A. (Jeanne Athya) |
| author2 | David K. Roylance. |
| author_facet | David K. Roylance. Thienprasit, Jeanne A. (Jeanne Athya) |
| author_sort | Thienprasit, Jeanne A. (Jeanne Athya) |
| collection | MIT |
| description | Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996. |
| first_indexed | 2024-09-23T14:06:51Z |
| format | Thesis |
| id | mit-1721.1/10613 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T14:06:51Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/106132019-04-11T07:13:20Z DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon Deep level transient spectrosopy of aluminum gettering of iron contaminants in boron-doped silicon. Thienprasit, Jeanne A. (Jeanne Athya) David K. Roylance. Massachusetts Institute of Technology. Dept. of Physics Physics Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996. Includes bibliographical references. by Jeanne A. Thienprasit. B.S. 2005-08-18T17:16:14Z 2005-08-18T17:16:14Z 1996 1996 Thesis http://hdl.handle.net/1721.1/10613 36228790 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 17 leaves 1463761 bytes 1463521 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Physics Thienprasit, Jeanne A. (Jeanne Athya) DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title | DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title_full | DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title_fullStr | DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title_full_unstemmed | DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title_short | DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon |
| title_sort | dlts characterization of aluminum gettering of iron contaminants in boron doped silicon |
| topic | Physics |
| url | http://hdl.handle.net/1721.1/10613 |
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