First pass yield analysis and improvement at a low volume, high mix semiconductor equipment manufacturing facility

Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Department of Mechanical Engineering, 2016.

Bibliographic Details
Main Author: Anand, Shaswat
Other Authors: Stanley Gershwin.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2017
Subjects:
Online Access:http://hdl.handle.net/1721.1/106686