Assessing the Device-performance Impacts of Structural Defects with TCAD Modeling
Advanced solar cell architectures like passivated emitter and rear (PERC) and heterojunction with intrinsic thin layer (HIT) are increasingly sensitive to bulk recombination. Present device models consider homogeneous bulk lifetime, which does not accurately reflect the effects of heterogeneously di...
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Elsevier
2017
|
| Online Access: | http://hdl.handle.net/1721.1/107413 https://orcid.org/0000-0001-8345-4937 |