Uncertainty quantification for integrated circuits: Stochastic spectral methods

Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient stochastic circuit simulators. This paper discusses the recent advances of stochastic spectral circuit s...

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Bibliographic Details
Main Authors: Zhang, Zheng, Elfadel, Ibrahim Abe M., Daniel, Luca
Other Authors: Massachusetts Institute of Technology. Research Laboratory of Electronics
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers (IEEE) 2017
Online Access:http://hdl.handle.net/1721.1/108266
https://orcid.org/0000-0002-5880-3151