Uncertainty quantification for integrated circuits: Stochastic spectral methods
Due to significant manufacturing process variations, the performance of integrated circuits (ICs) has become increasingly uncertain. Such uncertainties must be carefully quantified with efficient stochastic circuit simulators. This paper discusses the recent advances of stochastic spectral circuit s...
Main Authors: | Zhang, Zheng, Elfadel, Ibrahim Abe M., Daniel, Luca |
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Other Authors: | Massachusetts Institute of Technology. Research Laboratory of Electronics |
Format: | Article |
Language: | en_US |
Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2017
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Online Access: | http://hdl.handle.net/1721.1/108266 https://orcid.org/0000-0002-5880-3151 |
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