High-speed polysilicon CMOS photodetector for telecom and datacom

Absorption by mid-bandgap states in polysilicon or heavily implanted silicon has been previously utilized to implement guided-wave infrared photodetectors in CMOS compatible photonic platforms. Here, we demonstrate a resonant guided-wave photodetector based on the polysilicon layer that is used for...

Full description

Bibliographic Details
Main Authors: Atabaki, Amir H, Meng, Huaiyu, Alloatti, Luca, Mehta, Karan Kartik, Ram, Rajeev J
Other Authors: Massachusetts Institute of Technology. Research Laboratory of Electronics
Format: Article
Language:en_US
Published: American Institute of Physics (AIP) 2017
Online Access:http://hdl.handle.net/1721.1/111620
https://orcid.org/0000-0002-5020-5472
https://orcid.org/0000-0002-7635-8266
https://orcid.org/0000-0002-1245-4179
https://orcid.org/0000-0002-0917-7182
https://orcid.org/0000-0003-0420-2235
_version_ 1826207106949185536
author Atabaki, Amir H
Meng, Huaiyu
Alloatti, Luca
Mehta, Karan Kartik
Ram, Rajeev J
author2 Massachusetts Institute of Technology. Research Laboratory of Electronics
author_facet Massachusetts Institute of Technology. Research Laboratory of Electronics
Atabaki, Amir H
Meng, Huaiyu
Alloatti, Luca
Mehta, Karan Kartik
Ram, Rajeev J
author_sort Atabaki, Amir H
collection MIT
description Absorption by mid-bandgap states in polysilicon or heavily implanted silicon has been previously utilized to implement guided-wave infrared photodetectors in CMOS compatible photonic platforms. Here, we demonstrate a resonant guided-wave photodetector based on the polysilicon layer that is used for the transistor gate in a microelectronic SOI CMOS process without any change to the foundry process flow (“zero-change” CMOS). Through a combination of doping mask layers, a lateral pn junction diode in the polysilicon is demonstrated with a strong electric field to enable efficient photo-carrier extraction and high-speed operation. This photodetector has a responsivity of more than 0.14 A/W from 1300 to 1600 nm, a 10 GHz bandwidth, and 80 nA dark current at 15 V reverse bias.
first_indexed 2024-09-23T13:44:13Z
format Article
id mit-1721.1/111620
institution Massachusetts Institute of Technology
language en_US
last_indexed 2024-09-23T13:44:13Z
publishDate 2017
publisher American Institute of Physics (AIP)
record_format dspace
spelling mit-1721.1/1116202022-10-01T16:50:11Z High-speed polysilicon CMOS photodetector for telecom and datacom Atabaki, Amir H Meng, Huaiyu Alloatti, Luca Mehta, Karan Kartik Ram, Rajeev J Massachusetts Institute of Technology. Research Laboratory of Electronics Atabaki, Amir H Meng, Huaiyu Alloatti, Luca Mehta, Karan Kartik Ram, Rajeev J Absorption by mid-bandgap states in polysilicon or heavily implanted silicon has been previously utilized to implement guided-wave infrared photodetectors in CMOS compatible photonic platforms. Here, we demonstrate a resonant guided-wave photodetector based on the polysilicon layer that is used for the transistor gate in a microelectronic SOI CMOS process without any change to the foundry process flow (“zero-change” CMOS). Through a combination of doping mask layers, a lateral pn junction diode in the polysilicon is demonstrated with a strong electric field to enable efficient photo-carrier extraction and high-speed operation. This photodetector has a responsivity of more than 0.14 A/W from 1300 to 1600 nm, a 10 GHz bandwidth, and 80 nA dark current at 15 V reverse bias. United States. Defense Advanced Research Projects Agency (Award HR0011-11-C-0100) United States. Defense Advanced Research Projects Agency (Contract HR0011- 11-9-0009) 2017-09-21T20:14:41Z 2017-09-21T20:14:41Z 2017-09-21 Article http://purl.org/eprint/type/JournalArticle 0003-6951 1077-3118 http://hdl.handle.net/1721.1/111620 Atabaki, Amir H. et al. “High-Speed Polysilicon CMOS Photodetector for Telecom and Datacom.” Applied Physics Letters 109, 11 (September 2016): 111106 © 2016 AIP Publishing https://orcid.org/0000-0002-5020-5472 https://orcid.org/0000-0002-7635-8266 https://orcid.org/0000-0002-1245-4179 https://orcid.org/0000-0002-0917-7182 https://orcid.org/0000-0003-0420-2235 en_US http://dx.doi.org/10.1063/1.4962641 Applied Physics Letters Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. application/pdf American Institute of Physics (AIP) MIT Web Domain
spellingShingle Atabaki, Amir H
Meng, Huaiyu
Alloatti, Luca
Mehta, Karan Kartik
Ram, Rajeev J
High-speed polysilicon CMOS photodetector for telecom and datacom
title High-speed polysilicon CMOS photodetector for telecom and datacom
title_full High-speed polysilicon CMOS photodetector for telecom and datacom
title_fullStr High-speed polysilicon CMOS photodetector for telecom and datacom
title_full_unstemmed High-speed polysilicon CMOS photodetector for telecom and datacom
title_short High-speed polysilicon CMOS photodetector for telecom and datacom
title_sort high speed polysilicon cmos photodetector for telecom and datacom
url http://hdl.handle.net/1721.1/111620
https://orcid.org/0000-0002-5020-5472
https://orcid.org/0000-0002-7635-8266
https://orcid.org/0000-0002-1245-4179
https://orcid.org/0000-0002-0917-7182
https://orcid.org/0000-0003-0420-2235
work_keys_str_mv AT atabakiamirh highspeedpolysiliconcmosphotodetectorfortelecomanddatacom
AT menghuaiyu highspeedpolysiliconcmosphotodetectorfortelecomanddatacom
AT alloattiluca highspeedpolysiliconcmosphotodetectorfortelecomanddatacom
AT mehtakarankartik highspeedpolysiliconcmosphotodetectorfortelecomanddatacom
AT ramrajeevj highspeedpolysiliconcmosphotodetectorfortelecomanddatacom