Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2017.

Bibliographic Details
Main Author:	Warnock, Shireen M
Other Authors:	Jesús A. del Alamo.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2017
Subjects:	Electrical Engineering and Computer Science.
Online Access:	http://hdl.handle.net/1721.1/112032

Internet

http://hdl.handle.net/1721.1/112032