Heteroepitaxial growth of In In[subscript 0.30]Ga[subscript 0.70]As high-electron mobility transistor on 200 mm silicon substrate using metamorphic graded buffer
We report on the growth of an In[subscript 0.30]Ga[subscript 0.70]As channel high-electron mobility transistor (HEMT) on a 200 mm silicon wafer by metal organic vapor phase epitaxy. By using a 3 μm thick buffer comprising a Ge layer, a GaAs layer and an InAlAs compositionally graded strain relaxing...
Main Authors: | , , , , , , , , , , , |
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Other Authors: | |
Format: | Article |
Published: |
American Institute of Physics (AIP)
2017
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Online Access: | http://hdl.handle.net/1721.1/112299 https://orcid.org/0000-0002-2429-8943 |