Maximizing Reliability in WDM Networks through Lightpath Routing

We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath routing and the link failure probability. We show that in gene...

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Bibliographic Details
Main Authors: Lee, Hyang Won, Lee, Kayi, Modiano, Eytan H
Other Authors: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Format: Article
Language:en_US
Published: Institute of Electrical and Electronics Engineers (IEEE) 2018
Online Access:http://hdl.handle.net/1721.1/116664
https://orcid.org/0000-0001-8238-8130