Maximizing Reliability in WDM Networks through Lightpath Routing
We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath routing and the link failure probability. We show that in gene...
| Main Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | en_US |
| Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2018
|
| Online Access: | http://hdl.handle.net/1721.1/116664 https://orcid.org/0000-0001-8238-8130 |
| _version_ | 1826200603899985920 |
|---|---|
| author | Lee, Hyang Won Lee, Kayi Modiano, Eytan H |
| author2 | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics |
| author_facet | Massachusetts Institute of Technology. Department of Aeronautics and Astronautics Lee, Hyang Won Lee, Kayi Modiano, Eytan H |
| author_sort | Lee, Hyang Won |
| collection | MIT |
| description | We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath
routing and the link failure probability. We show that in general the optimal lightpath routing depends on the link failure probability, and characterize the properties of lightpath routings that maximize the reliability in different failure probability regimes. In particular, we show that in the low failure probability regime, maximizing the “cross-layer” min cut of the (layered) network maximizes reliability, whereas in the high failure probability regime, minimizing the spanning tree of the network maximizes reliability. Motivated by these results, we develop lightpath routing algorithms for reliability maximization. |
| first_indexed | 2024-09-23T11:39:01Z |
| format | Article |
| id | mit-1721.1/116664 |
| institution | Massachusetts Institute of Technology |
| language | en_US |
| last_indexed | 2024-09-23T11:39:01Z |
| publishDate | 2018 |
| publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| record_format | dspace |
| spelling | mit-1721.1/1166642022-09-27T20:59:19Z Maximizing Reliability in WDM Networks through Lightpath Routing Lee, Hyang Won Lee, Kayi Modiano, Eytan H Massachusetts Institute of Technology. Department of Aeronautics and Astronautics Lee, Hyang Won Lee, Kayi Modiano, Eytan H We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath routing and the link failure probability. We show that in general the optimal lightpath routing depends on the link failure probability, and characterize the properties of lightpath routings that maximize the reliability in different failure probability regimes. In particular, we show that in the low failure probability regime, maximizing the “cross-layer” min cut of the (layered) network maximizes reliability, whereas in the high failure probability regime, minimizing the spanning tree of the network maximizes reliability. Motivated by these results, we develop lightpath routing algorithms for reliability maximization. National Science Foundation (U.S.) (Grant CNS-0830961) National Science Foundation (U.S.) (Grant CNS-1017800) United States. Defense Threat Reduction Agency (Grant HDTRA1-07-1-0004) United States. Defense Threat Reduction Agency (Grant HDTRA-09-1-0050) 2018-06-27T18:37:51Z 2018-06-27T18:37:51Z 2012-01 2011-12 Article http://purl.org/eprint/type/ConferencePaper 978-1-4244-9268-8 978-1-4244-9266-4 978-1-4244-9267-1 http://hdl.handle.net/1721.1/116664 Hyang-Won Lee, et al. "Maximizing Reliability in WDM Networks through Lightpath Routing." 2011 IEEE Global Telecommunications Conference - GLOBECOM 2011, 5-9 December, 2011, Kathmandu, Nepal, IEEE, 2011, pp. 1–6. https://orcid.org/0000-0001-8238-8130 en_US http://dx.doi.org/10.1109/GLOCOM.2011.6133868 2011 IEEE Global Telecommunications Conference - GLOBECOM 2011 Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf Institute of Electrical and Electronics Engineers (IEEE) Prof. Modiano |
| spellingShingle | Lee, Hyang Won Lee, Kayi Modiano, Eytan H Maximizing Reliability in WDM Networks through Lightpath Routing |
| title | Maximizing Reliability in WDM Networks through Lightpath Routing |
| title_full | Maximizing Reliability in WDM Networks through Lightpath Routing |
| title_fullStr | Maximizing Reliability in WDM Networks through Lightpath Routing |
| title_full_unstemmed | Maximizing Reliability in WDM Networks through Lightpath Routing |
| title_short | Maximizing Reliability in WDM Networks through Lightpath Routing |
| title_sort | maximizing reliability in wdm networks through lightpath routing |
| url | http://hdl.handle.net/1721.1/116664 https://orcid.org/0000-0001-8238-8130 |
| work_keys_str_mv | AT leehyangwon maximizingreliabilityinwdmnetworksthroughlightpathrouting AT leekayi maximizingreliabilityinwdmnetworksthroughlightpathrouting AT modianoeytanh maximizingreliabilityinwdmnetworksthroughlightpathrouting |