Maximizing Reliability in WDM Networks through Lightpath Routing

We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath routing and the link failure probability. We show that in gene...

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Detalhes bibliográficos
Principais autores: Lee, Hyang Won, Lee, Kayi, Modiano, Eytan H
Outros Autores: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Formato: Artigo
Idioma:en_US
Publicado em: Institute of Electrical and Electronics Engineers (IEEE) 2018
Acesso em linha:http://hdl.handle.net/1721.1/116664
https://orcid.org/0000-0001-8238-8130