Electronic fingerprints of Cr and V dopants in the topological insulator Sb₂Te₃

Electronic fingerprints of Cr and V dopants in the topological insulator Sb₂Te₃

By combining scanning tunneling microscopy/spectroscopy and first-principles calculations, we systematically study the local electronic states of magnetic dopants V and Cr in the topological insulator (TI) Sb₂Te₃. Spectroscopic imaging shows diverse local defect states between Cr and V, which agree...

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Bibliographic Details
Main Authors: Zhang, Wenhan, West, Damien, Lee, Seng Huat, Qiu, Yunsheng, Hor, Yew San, Zhang, Shengbai, Wu, Weida, Chang, Cui-zu, Moodera, Jagadeesh
Other Authors: Francis Bitter Magnet Laboratory (Massachusetts Institute of Technology)
Format: Article
Language:English
Published: American Physical Society 2018
Online Access:http://hdl.handle.net/1721.1/118629
https://orcid.org/0000-0001-7413-5715
https://orcid.org/0000-0002-2480-1211

Internet

http://hdl.handle.net/1721.1/118629
https://orcid.org/0000-0001-7413-5715
https://orcid.org/0000-0002-2480-1211

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