Electronic fingerprints of Cr and V dopants in the topological insulator Sb₂Te₃
By combining scanning tunneling microscopy/spectroscopy and first-principles calculations, we systematically study the local electronic states of magnetic dopants V and Cr in the topological insulator (TI) Sb₂Te₃. Spectroscopic imaging shows diverse local defect states between Cr and V, which agree...
| Main Authors: | , , , , , , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2018
|
| Online Access: | http://hdl.handle.net/1721.1/118629 https://orcid.org/0000-0001-7413-5715 https://orcid.org/0000-0002-2480-1211 |