Crack detection in crystalline silicon solar cells using dark-field imaging

Crack detection in crystalline silicon solar cells using dark-field imaging

The high capital expenditure (capex) necessary to manufacture crystalline silicon PV modules negatively affects the levelized cost of electricity (¢/kWh) and critically impacts the rate at which the PV industry can scale up. Wafer, cell, and module fabrication with thin free-standing silicon wafers...

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Bibliographic Details
Main Authors: Wieghold, Sarah, Morishige, Ashley Elizabeth, Meyer, Luke, Buonassisi, Anthony, Sachs, Emanuel Michael
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Published: Elsevier 2018
Online Access:http://hdl.handle.net/1721.1/118895
https://orcid.org/0000-0001-9352-8741
https://orcid.org/0000-0001-8345-4937
https://orcid.org/0000-0001-6959-4810

Internet

http://hdl.handle.net/1721.1/118895
https://orcid.org/0000-0001-9352-8741
https://orcid.org/0000-0001-8345-4937
https://orcid.org/0000-0001-6959-4810

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