Synchrotron-based analysis of chromium distributions in multicrystalline silicon for solar cells

Synchrotron-based analysis of chromium distributions in multicrystalline silicon for solar cells

Chromium (Cr) can degrade silicon wafer-based solar cell efficiencies at concentrations as low as 10¹⁰cm⁻³. In this contribution, we employ synchrotron-based X-ray fluorescence microscopy to study chromium distributions in multicrystalline silicon in as-grown material and after phosphorous diffusion...

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Bibliographic Details
Main Authors: Coletti, Gianluca, Lai, Barry, Jensen, Mallory Ann, Hofstetter, Jasmin, Morishige, Ashley Elizabeth, Fenning, David P, Buonassisi, Anthony
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Published: American Institute of Physics (AIP) 2018
Online Access:http://hdl.handle.net/1721.1/118922
https://orcid.org/0000-0002-5353-0780
https://orcid.org/0000-0001-9352-8741
https://orcid.org/0000-0002-4609-9312
https://orcid.org/0000-0001-8345-4937

Internet

http://hdl.handle.net/1721.1/118922
https://orcid.org/0000-0002-5353-0780
https://orcid.org/0000-0001-9352-8741
https://orcid.org/0000-0002-4609-9312
https://orcid.org/0000-0001-8345-4937

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