Measurement of contact resistivity at metal-tin sulfide (SnS) interfaces

Measurement of contact resistivity at metal-tin sulfide (SnS) interfaces

We measured the contact resistivity between tin(II) sulfide (SnS) thin films and three different metals (Au, Mo, and Ti) using a transmission line method (TLM). The contact resistance increases in the order Au < Mo < Ti. The contact resistances for Au and Mo are low enough so that they do not...

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Bibliographic Details
Main Authors: Yang, Chuanxi, Sun, Leizhi, Kim, Sang Bok, Feng, Jun, Gordon, Roy G., Brandt, Riley E, Zhao, Xizhu, Buonassisi, Anthony
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Published: AIP Publishing 2018
Online Access:http://hdl.handle.net/1721.1/119181
https://orcid.org/0000-0003-2785-552X
https://orcid.org/0000-0001-8345-4937

Internet

http://hdl.handle.net/1721.1/119181
https://orcid.org/0000-0003-2785-552X
https://orcid.org/0000-0001-8345-4937

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