Microscopic Distributions of Defect Luminescence From Subgrain Boundaries in Multicrystalline Silicon Wafers
We investigate the microscopic distributions of sub-band-gap luminescence emission (the so-called D-lines D1/D2/D3/D4) and the band-to-band luminescence intensity, near recombination-active subgrain boundaries in multicrystalline silicon wafers for solar cells. We find that the sub-band-gap luminesc...
Main Authors: | Samundsett, Christian, Sio, Hang C., Lai, Barry, Li, Li, Nguyen, Hieu T., Jensen, Mallory Ann, Buonassisi, Anthony, MacDonald, Daniel G |
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Other Authors: | Massachusetts Institute of Technology. Department of Civil and Environmental Engineering |
Format: | Article |
Published: |
Institute of Electrical and Electronics Engineers (IEEE)
2018
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Online Access: | http://hdl.handle.net/1721.1/119182 https://orcid.org/0000-0002-5353-0780 https://orcid.org/0000-0001-8345-4937 |
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