Dynamic speckle illumination wide-field reflection phase microscopy
We demonstrate a quantitative reflection-phase microscope based on time-varying speckle-field illumination. Due to the short spatial coherence length of the speckle field, the proposed imaging system features superior lateral resolution, 520 nm, as well as high-depth selectivity, 1.03 μm. Off-axis i...
| Main Authors: | , , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
Optical Society of America
2019
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| Online Access: | http://hdl.handle.net/1721.1/119870 https://orcid.org/0000-0003-4698-6488 |