Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy
Thin film evaporation on microstructured surfaces is a promising strategy for high heat flux thermal management. To enhance fundamental understanding and optimize the overall heat transfer performance across a few microns thick liquid film, however, requires detailed thermal characterizations. Exist...
| Glavni autori: | , , , , , , |
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| Daljnji autori: | |
| Format: | Članak |
| Izdano: |
American Institute of Physics (AIP)
2019
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| Online pristup: | http://hdl.handle.net/1721.1/120128 https://orcid.org/0000-0001-9185-3161 https://orcid.org/0000-0002-5938-717X https://orcid.org/0000-0002-8865-859X https://orcid.org/0000-0002-5042-4819 https://orcid.org/0000-0001-8721-3591 https://orcid.org/0000-0001-7045-1200 |