Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy
Thin film evaporation on microstructured surfaces is a promising strategy for high heat flux thermal management. To enhance fundamental understanding and optimize the overall heat transfer performance across a few microns thick liquid film, however, requires detailed thermal characterizations. Exist...
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| Format: | Article |
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American Institute of Physics (AIP)
2019
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| Online Access: | http://hdl.handle.net/1721.1/120128 https://orcid.org/0000-0001-9185-3161 https://orcid.org/0000-0002-5938-717X https://orcid.org/0000-0002-8865-859X https://orcid.org/0000-0002-5042-4819 https://orcid.org/0000-0001-8721-3591 https://orcid.org/0000-0001-7045-1200 |
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| author | Zhang, Lenan Zhu, Yangying Lu, Zhengmao Zhao, Lin Bagnall, Kevin R. Rao, Sameer R Wang, Evelyn |
| author2 | Lincoln Laboratory |
| author_facet | Lincoln Laboratory Zhang, Lenan Zhu, Yangying Lu, Zhengmao Zhao, Lin Bagnall, Kevin R. Rao, Sameer R Wang, Evelyn |
| author_sort | Zhang, Lenan |
| collection | MIT |
| description | Thin film evaporation on microstructured surfaces is a promising strategy for high heat flux thermal management. To enhance fundamental understanding and optimize the overall heat transfer performance across a few microns thick liquid film, however, requires detailed thermal characterizations. Existing characterization techniques using infrared thermometry or contact-mode temperature sensors such as thermocouples and resistance temperature detectors cannot accurately measure the temperature of the thin liquid film near the three-phase contact line due to the restriction of low spatial resolution or temperature sensitivity. In this work, we developed a non-contact, in situ temperature measurement approach using a custom micro-Raman spectroscopy platform which has a spatial resolution of 1.5 μm and temperature sensitivity within 0.5 °C. We utilized this method to characterize thin film evaporation from fabricated silicon micropillar arrays. We showed that we can accurately measure the local thin film temperature and map the overall temperature distribution on the structured surfaces at different heat fluxes. We investigated the effects of micropillar array geometries and showed that the temperature rise of the liquid was reduced with the decreasing micropillar pitch due to the increased fraction of the thin film area. This work offers a promising method with micro-Raman to quantify phase change heat transfer on microstructured surfaces. This characterization technique can significantly aid mechanistic understanding and wick structure optimization for various phase-change based thermal management devices. |
| first_indexed | 2024-09-23T13:44:15Z |
| format | Article |
| id | mit-1721.1/120128 |
| institution | Massachusetts Institute of Technology |
| last_indexed | 2024-09-23T13:44:15Z |
| publishDate | 2019 |
| publisher | American Institute of Physics (AIP) |
| record_format | dspace |
| spelling | mit-1721.1/1201282022-10-01T16:51:03Z Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy Zhang, Lenan Zhu, Yangying Lu, Zhengmao Zhao, Lin Bagnall, Kevin R. Rao, Sameer R Wang, Evelyn Lincoln Laboratory Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Research Laboratory of Electronics Zhang, Lenan Zhu, Yangying Lu, Zhengmao Zhao, Lin Bagnall, Kevin R. Rao, Sameer R Wang, Evelyn Thin film evaporation on microstructured surfaces is a promising strategy for high heat flux thermal management. To enhance fundamental understanding and optimize the overall heat transfer performance across a few microns thick liquid film, however, requires detailed thermal characterizations. Existing characterization techniques using infrared thermometry or contact-mode temperature sensors such as thermocouples and resistance temperature detectors cannot accurately measure the temperature of the thin liquid film near the three-phase contact line due to the restriction of low spatial resolution or temperature sensitivity. In this work, we developed a non-contact, in situ temperature measurement approach using a custom micro-Raman spectroscopy platform which has a spatial resolution of 1.5 μm and temperature sensitivity within 0.5 °C. We utilized this method to characterize thin film evaporation from fabricated silicon micropillar arrays. We showed that we can accurately measure the local thin film temperature and map the overall temperature distribution on the structured surfaces at different heat fluxes. We investigated the effects of micropillar array geometries and showed that the temperature rise of the liquid was reduced with the decreasing micropillar pitch due to the increased fraction of the thin film area. This work offers a promising method with micro-Raman to quantify phase change heat transfer on microstructured surfaces. This characterization technique can significantly aid mechanistic understanding and wick structure optimization for various phase-change based thermal management devices. Singapore-MIT Alliance for Research and Technology (SMART) MIT/MTL Gallium Nitride (GaN) Energy Initiative United States. Office of Naval Research (Award N00014-15-1-2483) United States. Air Force. Office of Scientific Research (Award FA9550-15-1-0310) 2019-01-24T18:53:01Z 2019-01-24T18:53:01Z 2018-10 2019-01-10T17:47:35Z Article http://purl.org/eprint/type/JournalArticle 0003-6951 1077-3118 http://hdl.handle.net/1721.1/120128 Zhang, Lenan, Yangying Zhu, Zhengmao Lu, Lin Zhao, Kevin R. Bagnall, Sameer R. Rao, and Evelyn N. Wang. “Characterization of Thin Film Evaporation in Micropillar Wicks Using Micro-Raman Spectroscopy.” Applied Physics Letters 113, no. 16 (October 15, 2018): 163701. https://orcid.org/0000-0001-9185-3161 https://orcid.org/0000-0002-5938-717X https://orcid.org/0000-0002-8865-859X https://orcid.org/0000-0002-5042-4819 https://orcid.org/0000-0001-8721-3591 https://orcid.org/0000-0001-7045-1200 http://dx.doi.org/10.1063/1.5048837 Applied Physics Letters Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf American Institute of Physics (AIP) Other repository |
| spellingShingle | Zhang, Lenan Zhu, Yangying Lu, Zhengmao Zhao, Lin Bagnall, Kevin R. Rao, Sameer R Wang, Evelyn Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title | Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title_full | Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title_fullStr | Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title_full_unstemmed | Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title_short | Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy |
| title_sort | characterization of thin film evaporation in micropillar wicks using micro raman spectroscopy |
| url | http://hdl.handle.net/1721.1/120128 https://orcid.org/0000-0001-9185-3161 https://orcid.org/0000-0002-5938-717X https://orcid.org/0000-0002-8865-859X https://orcid.org/0000-0002-5042-4819 https://orcid.org/0000-0001-8721-3591 https://orcid.org/0000-0001-7045-1200 |
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